الفهرس | Only 14 pages are availabe for public view |
Abstract The research work described in this thesis is devoted to measure noise in SIMOX MOSFET’s (low frequency) . The thesis contains three chapters. The first chapter contains a brief about the different kinds of noise. It demonstrates the effect of noise in low frequency of MOS and SIMOX transistors. The second chapter gives a review about the SOl technologies. The advantages and draw backs of various SOl materials are outlined. The front runner amongst them is seem to be SIMOX , and it gives a brief review on SIMOX where transistors different contribution of the principle and parasitic transistors were described. The third chapter discusses practical part which is composed of the following items: A set up was built to measure I - V characteristic curves by using automatic measurements to measure and to detect the threshold voltage on MOS and SIMOX transistors.A set up to measure the high frequency noise in resistors manually and then to develop the set up to perform the mesurements automatically.A set up to measure the low frequency noise in MOS and SIMOX transistors manually and automatically. Finally , a discussion and an analysis of the measured results was introduced. |